ÿþ<html><head> <title>Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications</title></head> <body bgcolor="#ffffff"> <center> <em>IEEE Transactions on Reliability, Vol. 58, No. 2, pp. 264-270, June 2009</em><br><h2><strong>Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications</strong></h2> <p><strong>Leoncio D. Lopez<br> </strong>RAS Computer Analysis Laboratory<br> Sun Microsystems, Inc., <br> San Diego, CA 92121 USA</p> <p><strong> Michael Pecht </strong><br> <em>Fellow, IEEE</em><br> City University of Hong Kong <br> Hong Kong, China<br> and<br> Center for Advanced Life Cycle Engineering (CALCE)<br> University of Maryland<br> College Park, MD 20742<br> <br> </p> </center> <b>Abstract:</b> <p>We present a methodology based on the physics of failure, and the sequential probability ratio test, for modeling and monitoring electrical interconnects in health monitoring, and electronic prognostic applications. The resistance behavior of an electrical contact was characterized as a function of temperature. The physics of failure of the contact technology were analysed. A contact resistance model was selected, and its parameters were fitted using the temperature characterization data. The physics of failure model was evaluated with a reliability application (temperature cycle test), and was found to produce estimation errors of &lt; 1m&#8486; during a training period. The temperature and resistance of ten sample contacts were continuously monitored during the temperature cycle test, identifying the maximum temperature and resistances for each cycle. Using the physics of failure model, maximum resistance estimates were generated for each test sample. The residual between the monitored and estimated resistance values was evaluated with the sequential probability ratio test. The method was shown to overcome the issues of traditional threshold-based monitoring approaches, providing accurate resistance estimates, and allowing the detection of abnormal resistance behavior with low false alarm and missed alarm probabilities.</p> <p><strong>Index Terms</strong>: Accelerated test, contact resistance, elastomer socket, health monitoring, physics of failure.</p> <p><a href="../../fulltext/2009/ModelingIC_Socket.pdf">Complete article</a> is available to CALCE Consortium Members.</p> <p><font size="-2"><font color="red">&copy; IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.</font></font></p> <hr><br> <center> [<a href="http://www.calce.umd.edu">Home Page</a>] [<a href="../../">Articles Page</a>] </center> <center> <font size="-1">Copyright &copy; 2009 by CALCE and the University of Maryland, All Rights Reserved </font> </center> </body></html>