Materials Characterization
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Chemical analysis in the E-SEM is performed using energy
dispersive spectroscopy (EDS). EDS measures the energy
and intensity distribution of X-ray signals generated by the
electron beam striking the surface of the specimen. The
elemental composition at a point, along a line, or in a defined
area can be easily determined to a high degree of precision
(~0.1 wt.%).
In the failure analysis of electronic products, EDS can be crucial in determining solder composition, examining plating quality, determining the location and source of contamination, and performing reverse engineering. |
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Energy Dispersive Spectroscopy (EDS)
Investigation of Contamination Analysis of Intermetallic Formation |
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