Failure Identification and Reliability Modeling

Substrates and Circuit Card Assemblies Roadmap

Objective:

Analyze, characterize and model the reliability of circuit card assemblies via the identification of failure modes, sites and mechanisms, and the effects of design and environment. Resulting models documented and inserted into Web-based handbook and calcePWA software.

Outline:

  Stress drivers

  Failure mechanism and models

  Failure sites

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