Risk-Informed Technology Insertion Methodologies

Objective:

Identify and develop risk assessment methods and guidelines (and influence standards development) for electronic products and systems.

Projects: (Links are for Members only)

• C03-25 Assessing Continuous Technology Insertion and Obsolescence Management Capability -An Evaluation of Viability
• C02-04 Review and Assessment of Telcordia Reliability Specifications
• C02-10 Life Consumption Monitoring
• C01-17 Probabilistic Simulation in the Virtual Qualification Process
• C01-18 Implementing the Failure Free Operating Period Process
• C01-19 Life Consumption Monitoring
• C00-50 Life-Consumption Monitoring Enabled Physics of Failure Analysis
• C00-48 Development of a Risk Informed Avionics Technology Insertion Roadmap
• C99-43 Life Consumption Monitoring Systems
• C99-02 Process for Implementing Maintenance/Failure Free Operating Periods in Electronic Systems
• C99-01 ssessment of Reliability Prediction Methodologies
• C98-47 Health Monitoring of Electronic Systems
• C98-48 Analysis of Cannot Duplicate (CND) Failures
• C98-49 Assessing and mitigating risks in low volume complex electronic systems
• C97-20 Health Management of Electronic Systems
• C96-20 Health Management of Electronic Systems
• C96-01 Probabilistic Physics of Failure of Electronic Hardware
• C96-05 Reliability Assessment Methodology for Electronic Systems
• C93-16 Physics-of-Failure Based Reliability Study

Reports: (Links are for Members only)

• DRAFT Assessment of Reliability Prediction Methodologies (2000)
• Process for Implementing Maintenance Free / Failure Free Operating Periods in Electronic Systems (1999)
• Draft Process for Implementing Maintenance Free / Failure Free Operating Periods in Electronic Systems (1999)
• DRAFT Assessment of Reliability Prediction Methodologies (1999)
• Trends in Component Reliability and Testing (1999)
• A Feasibility Study on Health Monitoring and Early Detection Fuse Structures (1997)
• Smart Electronic Systems for Condition-Based Health Management (1996)
• Incorporation of a Probability Factor in Failure Mechanism Models (1996)
• Combination of Probabilistic Variability with Deterministic Physics Based Failure Models (1996)
• Reliability Methods and Models: An Alternative Approach (1996)
• Physics-of-Failure Approach to Design and Reliability Assessment of Microelectronic Packages (1995)
• Issues Affecting Early Affordable Access to Leading Electronics Technologies by the US Military and Government (1995)
• Why the Traditional Reliability Prediction Models Do Not Work - Is There an Alternative? (1995)
• U.S. Army Reliability Standardization Improvement Policy and Its Impact (1995)
• General Motors Component Specification Documentation Released (1995)
• Physics of Failure: An Approach to Reliable Product Development (1994)
• A Physics-Of-Failure (POF) Approach to Addressing Device Reliability in Accelerated Testing (1993)
• Comparison of Electronics-Reliability Assessment Approaches (1993)
• IEEE Transactions on Reliability tutorials on electronics failure mechanisms: (1993)
• Are Components Still the Major Problem: A Review of Electronic System and Device Field Failure Returns (1992)

Education:

• Education
• Physics of Failure and Reliability
• Overview of EPSC Graduate PRogram

Point of Contact:

• Dr. M. Pecht

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