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The Center for Advanced Life Cycle Engineering (CALCE) is extremely pleased to announce that it
is now the world’s largest electronic products and systems
research center focused on electronics reliability. With our new
laboratory facilities and support from over 100 corporate sponsors,
this year’s revenues top $7M. We are now conducting
state-of-the-art research on electronic devices, electronics packaging,
product reliability and systems risk assessment; providing the most
sophisticated and practical failure analysis to companies; teaching
classes to industry on electronic products development and reliability;
and providing guidance to companies on a host of life-cycle engineering
tasks. We are also committed to providing cost-effective and practical
solutions to companies.
CALCE
is recognized as a founder and driving force behind the
development and implementation of physics-of-failure (PoF) approaches to
reliability, as well as a world leader in accelerated testing, electronic parts selection and management,
and supply-chain management. CALCE is at the forefront of international standards development for
critical electronic systems having chaired the development of several
reliability and part selection standards. CALCE is staffed by
over 100 faculty, staff and students, and in 1999 became the first
academic research facility in the world to be ISO 9001 certified.
Collectively, CALCE researchers have authored over 35 internationally
acclaimed textbooks and well over 1000 research publications relevant to
electronics reliability. Over the last 15 years, CALCE has
invested over $75 million in developing methodologies, models, and
tools that address the design, manufacture, analysis, and management
of electronic systems.
The mission of CALCE is to develop scientifically based innovative methodologies that decrease
life cycle risks for the next generation of electronic products and
systems, and to provide an educational and technology transfer
infrastructure for their rapid dissemination and utilization.
As we move into the summer of 2008, the electronics
industry is seeing continued growth, but we have been observing an
increasing number of reliability concerns. For example, field failures
of ceramic capacitors are occurring with greater frequency and are
traceable to a number of manufacturing processes, handling, and circuit
board assembly issues. To solve such problems, CALCE Test Services and
Failure Analysis Laboratory continues to provide outstanding services,
including proprietary design reviews, reliability assessments, material
characterization, and failure analysis support. In the first half of
2007, the lab has conducted over sixty failure analysis services for
companies and provides alerts for two Fortune 500 companies as well.
The CALCE Electronic Products and Systems
Consortium is conducting research on a host of company-sponsored
subjects, including lead-free electronics, design-for-reliability (DfR)
methods, and supply chain risk assessment. One particular concern is
that CALCE has been observing a rapid influx of counterfeit parts into
the supply chains of many companies. CALCE has been developing
techniques to help manufacturers identify and combat counterfeiting.
CALCE will hold an International Symposium on Avoiding, Detecting, and
Preventing Counterfeiting in November to enable dissemination of the
latest knowledge in this area.
The CALCE Prognostics and Health Management (PHM)
Consortium has now grown to 14 companies. Participation in the PHMC
places members at the forefront of prognostics and health management.
CALCE’s accomplishments in this area include (1) mapping of
sensor technologies with stress and damage models to assess real-time
life consumption monitoring (LCM) of electronic systems, (2)
demonstrating the LCM methodology on an electronic board operated in an
automotive under-hood environment, (3) evaluating diagnostic
built-in-test (BIT) software-firmware systems for fault identification
and isolation that incorporate error detection and correction circuits,
and self-checking and self-verification circuits, (4) integrating
in-situ semiconductor prognostic monitors consisting of pre-calibrated
cells (circuits) to predict remaining life considering semiconductor
defects and failure mechanisms, (5) developing software modules (data
collection, simplification and damage accumulation and remaining life
estimation) for environment and usage data collection that enable PHM,
(6) assessing health using physical inspection, accelerated testing and
physics-of-failure analysis combined, and (7) developing models and
tools for optimizing maintenance planning and assessing ROI using PHM.
I invite you to become an active participant with
CALCE and make use of our expertise and numerous resources. If you are
interested in our research and analysis, visit us in person or visit us
on the web at www.calce.umd.edu. I look forward to working with you.
If your organization is interested in utilizing
CALCE expertise
and resources, you can contact me directly at pecht@calce.umd.edu.
Michael Pecht
Chair Professor and Director
Prof Michael Pecht has an MS in Electrical Engineering and an MS and PhD in Engineering Mechanics from the University of Wisconsin at Madison.
He is a Professional Engineer, an IEEE Fellow, an ASME Fellow and an IMAPS Fellow. He served as chief editor of the IEEE Transactions on Reliability
for eight years and on the advisory board of IEEE Spectrum. He is chief editor for Microelectronics Reliability and an associate editor for the
IEEE Transactions on Components and Packaging Technology. He is the founder of CALCE (Center for Advanced Life Cycle Engineering)
at the University of Maryland, College Park, where he is also a Chair Professor in Mechanical Engineering. He has written more than
twenty books on electronic products development, use and supply chain management and over 400 technical articles. He has been leading
a research team in the area of prognostics for the past ten years, and has now formed a new Prognostics and Health Management Consortium
at the University of Maryland. He has consulted for over 50 major international electronics companies, providing expertise in strategic planning,
design, test, prognostics, IP and risk assessment of electronic products and systems. He was awarded the highest reliability honor, the
IEEE Reliability Society?s Lifetime Achievement Award in 2008. He has previously received the European Micro and Nano-Reliability Award
for outstanding contributions to reliability research, 3M Research Award for electronics packaging, and the
IMAPS William D. Ashman Memorial Achievement Award for his contributions in electronics reliability analysis.
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