Ahmed N. Amin received the B.S. degree in electrical engineering from Syracuse University, Syracuse, NY, in 1977. Ahmed has over 28 years experience in device, package, and assembly level root cause failure analysis (FA) using variety state-of-the art analytical instruments and tools over the years. He had developed and used analytical techniques appropriate for specific failure modes to document their mechanisms. He conducted device and package level reliability qualifications and testing for commercial, military, and space programs during his career. He has solid FA experience on current Low-K flip chip and wire bonded semiconductor devices and packages, hybrid integrated circuits (thin and thick film), fiber optic components, thin film transistor display panels, microelectronic assemblies, flex circuits, and printed circuit boards. Ahmed was recently a Member of Technical Staff at LSI Corporation/Agere System, Allentown PA. His previous employers include, Lucent Technologies, Sterling Diagnostic Imaging/Direct Radiography Corp., E-Systems, General Electric Company, and Sperry Computer System.

Room 0128 Martin Hall (Building 88)
Center for Advanced Life Cycle Engineering
University of Maryland
College Park, MD 20742
Tel: (301) 405-5316
Fax: (301) 314-9269 aminan@calce.umd.edu