CALCE News©



Every 6 months, the CALCE News is sent to over 25,000 people from all sectors of the electronic products industry. The CALCE News covers latest research development, Center activities and publication. If you would like to sign up to be on the mailing list, fill out this form here.

Published issues:

Fall 2007

Spring 2007

Fall 2006

Spring 2006

Fall 2005

Spring 2005

-CALCE EPSC Offers Design Reviews and Reliability Capability Audit Programs for Companies
-CALCE Leads Sensor Roadmapping Efforts at NEMI
-Guideline Development for Assessment of Lead Refinishing by Solder Dipping
-CALCE Finds that Pb-free Electronics Can Be More Reliable, but Not Always
-Reliability Assessment of Electronic Assemblies under High-G (Artillery Launch) Loads
-Humidity Degradation of Base Metal Electrode Multilayer Ceramic Capacitors
-Prediction of Transient Component-Board Heat Transfer
-CALCE Wins NSF Grant to Work on Forecasting Electronic Part Obsolescence
-Samsung Techwin Engineers and Prof. B. T. Han Win Gold Award for Best Paper
-CALCE Offering Course at SEMI-THERM
-Dr. Valérie Eveloy Joins CALCE EPSC
-New Thermal Characterization Equipment Acquired by CALCE EPSC

Fall/Winter 2004

-Integrated Health Monitoring and Prognostics for Electronic Products and Systems
-Reliability Training for Companies
-CALCE EPSC Long-term Lead-free Reliability Studies
-Using Carbon Fibers in Electronic Interconnects
-CALCE EPSC Six Sigma Workshop
-CALCE EPSC Decision Support Model for Prognostic Health Management
-Sensor and MEMS Efforts at CALCE EPSC
-Heat Treatment, Tin Whisker Study
-CALCE Investigates Product Take-back
-Advances in Thermal Management
-Major Grants Awarded to Prof. B. Han
-Prof. M. Pecht Made Honorary Professor
-New CALCE Research Scientists

Spring/Summer 2004

-CALCE Pb-free Simulation Capabilities
-Dr. Das Develops Six Sigma Materials for Celestica
-CALCE Pioneers Noise Mitigation Designs for High-speed PCBs
-Effect of Flip-chip Package Warpage on Thermal Interfaces
-Failure Analysis and Virtual Qualification of PBGA Under Multiple Environmental Loadings
-Extreme Environment Electronics Efforts at CALCE EPSC

Fall/Winter 2003

-Message from the Director
-Lead-Free Software IP Management
-CALCE Develops Wireless Monitoring of Environmental Data
-New Test Economics Models Optimize Functional Test Placement in Manufacturing Processes
-Low Temperature Electronics Research
-CALCE Develops and Implements Uprateability Risk Assessment Criteria
-Test and Analysis in the Global Marketplace
-Failure in BME Capacitors
-Moisture Expansion Can Cause More Stress Than Thermal Expansion
-CALCE Center Provides Six Sigma Training Material
-Professor Sandborn Receives Invention of the Year Award
-CALCE MOCA 1.3 Software Released
-New Package Decapsulator at the Center

Spring/Summer 2003

-CALCE R&D Model Influential Around the World
-Intellectual Property and Lead-Free Solders
-Effect of Mold Compound Swelling on PEM Reliability
-Power Electronics Reliability Efforts at the CALCE EPSC
-Electrochemical Migration on Printed Wiring Boards
-CALCE Provides Root Cause Analysis for ESD Failures
-CALCE/University of Missouri Collaboration on Unique Radiation Shielding
-CALCE Collaborating with Merix on NSF Premise Program Grant

Summer/Fall 2002

-Message from the Director
-CALCE Expands New EMI/EMC Facilities
-Lead-Free Research at CALCE: An Update
-Phosphorus Molding Compounds
-Risks of Conductive Whiskers in Electronics from Pure Tin Coatings
-Using Scanning SQUID Microscopy for Detecting Electrical Shorts
-Cost Model for Concurrent Use with Hardware/Software Co-design
-New Research on Obsolescence Management
-Equipment Donations

Spring 2002

-Uprating Stirs Debate
-Reliability Assessment of Critical Oil Exploration and Recovery Electronics
-Selecting and Managing a PCB Supplier
-Obsolescence Cost Analysis Software Tool
-Failure Mechanisms in LEDs and Laser Diodes
-Hollow Fibers and Conductive Filament Formation
-Directions for Selecting Molding Compounds for Flip-Chip Devices
-CALCE EPSC and City University of Hong Kong Establish Joint FA Lab
-IEEE Guidebook 1413.1

Winter 2001

-Remaining Life Assessment for Critical Space Electronics Performed at CALCE
-Lead-free Initiative at CALCE: An Update
-calcePWA Virtual Qualification Used on Honeywell Engine Control Module
-Ceramic Capacitor Failure on the Rise
-Release of CADMP-II Version 2.6
-Embedded Passives Cost Analysis Software
-Assessment of Plasma Display Panel (PDP) Technology at CALCE
-Anechoic Chamber: Greater Electromagnetic Research and Testing Capabilities at CALCE

Spring 2001

-New Equipment to Benefit Members
-Electromagnetic Radiation: A Growing Concern in Electronic Products Design
-Lead-free Initiatives at CALCE
-CALCE Consortium Telecommunications Working Group Meets
-NASA/CALCE Collaborative Partnership
-CALCE Performs Chip-scale Package (CSP) Qualification for Raytheon
-CALCE Embedded Passive Models Used in NEMI 2000 Roadmap
-CALCE Develops Web-based Courseware for Electronic Products Cost Analysis
-Avionics Roadmap 2000 Conference: a Success
-CALCE Contract Assembly Website Completed
-Addressing New Strategies for Ensuring Reliability of Printed Circuit Assemblies

Summer/Fall 2000

-CALCE Center - First Academic Research Institution to be ISO 9001 Certified
-CALCE Laboratory Services Summary
-CALCE Consortium Addresses Lead-free Solder Durability Concerns
-Research in Portable Electronics Gains Attention from Industry
-CALCE Adds Advanced Photomechanics Capabilities
-CALCE Leads Development of Power Electronics Technology
-CALCE Center Contribute to IEC Standards Development
-CALCE Center Spearheads IEEE Reliability Standards Development
-ATMEL Uses CALCE Research Results as their SMT Assembly Guideline

August 1999

-Legal Issues of Uprating
-CALCE Conducts Virtual Qualification on AAAV
-CALCE Awarded Contract to Study Embedded Passives
-Optoelectronics Faculty Receive NSF Industry Matching Award for LED Reliability Project
-Benchmarking Activities with Lucas Aerospace
-CALCE Study on Plastic Packaged GaAs and AlGaAs LED's Enters Analysis Stage
-Litton-AMECON Digital MCM Trade-off Analysis
-Study on Variable Frequency Microwave Cure Process for Electronic Packages is Completed
-Failure Analysis for the Next Millennium
-Fiber Sensors Used in CALCE Studies on Fiber Connector Pistoning

February 1999
-CALCE Members Demonstrate Accelerated Qualification on Production Hardware
-CALCE Awarded Contract to Study RF MEMS Technology
-CALCE Forms 3D Integration Alliance
-CALCE Parts Selection and Management Benchmarking Activities
-CALCE Selected for Air Force Contract Award
-CALCE Awarded SRC Contract on Thermal Management
-On-Line Solder Joint Failure Analysis Tools Address Industry Needs
-IEEE 1413 Reliability Prediction Standard Approval and Subsequent Efforts
-Electronic Components Alliance Grows as the Need for Virtual Qualification Grows

September 1998

-CALCE Releases Web-based Handbook for Accelerated Testing
-Parts Selection and Management Progress
-CALCE Educational Initiative Wins National Award
-CALCE and ISIS Initiate Collaboration
-A Tool for Virtual Risk Assessment of Microelectronic Components
-CalcePWA Models in IcePack

February 1998
-CALCE Consortium Projects Summary

June 1997
-Increased Synergism in CALCE Research
-Commercial Insertion Success Story - RoughWriter 365
-CalcePWA Migrates to Sun Solaris 2.5
-Plasma Cleaning Added To Green Manufacturing Research Program
-CALCE Studies Encapsulated And Underfill Assembly Using Variable
  Frequency Microwave Source
-CALCE Researchers Work To Develop Next Generation Automobiles
-Laser Flash Thermal Measurement Capability Acquired By CALCE
-Designing it Right the First Time with CADMP-II

January 1997
-CALCE and Member Company Share Uprating Success
-CALCE Graduates Sought After By Industry
-CALCE Addresses Industry Concerns
-Are Your Packages Popcorning?
-A New Method for Real-Time Observation of Processing and Aging Sequences in Solder

August 1996
-CALCE Efforts in High-Temperature Electronics
-CALCE Receives NCMS Award to Study Lead-free Solders
-CALCE Optoelectronics Group Now Focusing on Adhesive Epoxies for Fiber Optic Applications
-Ruggedization of Laptop Computers for Mobile Applications
-Electronics Products and Reliability (EPAR) Study Program for M.S. and Ph.D.s
-Contact and Connector Studies
-New Equipment Acquisitions
-CALCE Electronic Packaging Manufacturing Lab
-MEMs-Based Packaging
-Solder Paste Process Control
-CALCE Students' Summer Cooperative Projects
-Directed Studies in Critical Technologies Award

February 1996
-Laser Inspection System Donation
-Ion Mobility in Molding Compounds
-High Temperature Electronics TRP
-Laser Diode Thermal Management Modeling
-Optoelectronic Reliability Assessment

August 1995
-Timely Product Development
-Health Management of Electronic Systems
-Long Term Storage Reliability of PEMs
-CALCE Offers Services to Qualify PQFPs and PBGAs for Popcorning
-Electronic Equipment Physics-of-Failure
-Thermal Management of Portable Electronic Equipment
-Parts Selection

February 1995
- Electronics at Elevated Temperatures
- Popcorn-free Manufacturing with PEMs
- Conductive Filament Formation Workshop
- Electronic Packaging E-SEM Applications
- Characterization of Non-woven-fiber PCBs
- Passive Cooling of Vented Enclosures

September 1994
- Reliability of Uncooled Infrared Sensors
- Knowledge Based Design Advisor
- Material Characterization CRADA
- Accelerated Testing of Surface Mount
- CADMP-II Software v1.0 Released
- System Level Thermal Control Simulation
- Patran Interface

February 1994
- Electronic Packaging of Power Supplies
- In-plane Motion Under Vibration Loading
- Derating Project Sponsored by SRC
- Reliability of Electronics at the Box-level
- Phase Change Materials
- Phase Change Material Slurry
- Connector Reliability
- Surface Mount Capacitor Reliability
- Through-hole Connectors
- Accelerated Testing
- Electro-optics Physics-of-Failure Project

September 1993
- Combined Vibration and Thermal Loading
- Highly Accelerated Stress Tests
- Tensile Tests of Polyimide Films in E-SEM
- Radiation Effects Facilities
- A New Model for Solder Joint Fatigue
- Physics of Failure for Microelectronics
- Unix Software Released
- Optoelectronic Research Center

May 1993
- Defense Conversion and Dual Use
- Plastic Package Reliability Study
- Materials Database Available
- Beta Version of POF Software Released
- Statistical Distribution Software Available
- Design for Environmental Compatibility
- Vibration Assessment of Wedge Locks
- Reliability of Electronic Boxes
- Wear Testing of Connectors

January 1993
- FEA Modeling For REL-TECH
- Plastic Encapsulation of Microelectronics
- Boeing-DoD Qualification Studies for SMA
- Connector Reliability Modeling
- Workshop on Temperature Effects

August 1992
- Plastic Package Effort
- Thermal-Mechanical Properties of Flex Circuits
- PWB Failure Identification
- FEA Modeling For REL-TECH
- Texas Instruments Integrates CALCE Software for R&M Engineering Workstation

January 1992
- Investigation of Potential Failure Mechanisms of HDI Packages
- Physics of Failure Based Package Compiler Software for Design and Reliability Assessment
- Connector Reliability Modeling
- Manufacturing Qualification, Design and Reliability Testing of Analog Integrated Circuits on GaAs
- Diamond Substrates for Low Cost Packaging

September 1991
- Endurance Testing of Ceramic vs. Plastic IC in High Temperature and Humidity
  Environment Yields Important Results
- An Alternative Wire Bond Test
- CALCE and Westinghouse Collaborate on AWACS Project
- Litton - CALCE Plated-Through-Hole Study
- Diamond Heat Sinks For Advanced Packaging - Investigations with LPS
- Boeing Commercial Airplanes Group Funds Expanded Effort to Develop An Improved Design
  Model for Electronic Packaging
- Center Research on Reliability of MMICs
- Collins Avionics and CALCE Study Cathodic-Anodic Filament
- Investigations Into the Effects of Temperature Continue With Phase II Support
- The Performs Vibration Test and Simulation of Advanced Circuit Boards for
   General Dynamics
- Characterization of Packaging Materials a Student Edition of CALCE Software

January 1991
- New Thrust in Cost Effectiveness of Electronics Designs
- Summaries of Recent Significant Technical Activities
- CALCE Center Applies Concurrent Engineering Concepts to MIMICs
- Study on the Influence of Temperature on IC Reliability