Created: 5/21/95

Updated: 8/05/98

Damage Due to Lead Insertion in Through-Hole Connectors

Project Number: C94-06
Point of Contact: dasgupta@calce.umd.edu


Objective

Develop mechanistic predictive models to predict the damage caused in plated-through holes (PTHs) and in the surrounding printed wiring board (PWB) by the forces generated by compliant pins in an insertion-mount connector.

 

Background

There is significant evidence that local forces generated by the compliant pins of insertion- mount connectors cause local damage and permanent deformation to the PTH hole-wall. This leads to concerns over the reliability of the PTH, as well as to the possibility of damaging neighboring traces in fine-pitch technology. Current acceptance methods involve cross-sectioning samples and visually quantifying damage for each new configuration. Unfortunately, the lack of existing quantitative models of this failure mode requires ad hoc empirical acceptance standards that are expensive to implement and questionable in value. Further, the design and manufacturing variabilities of the associated geometric and material variables necessitates a very large test matrix in any empirical methodology. The connector industry estimates that the associated hidden factory cost is on the order of hundreds of thousands of dollars per year, a cost that is ultimately passed on to customers.

 One possible cost-effective solution is to develop and validate quantitative mechanistic models that can predict the magnitude of damage and deformation based on physical parameters of the system, such as pin diameter, PTH diameter, pin material, PTH plating material, PWB material, and plating thickness. Such models would reduce the need for highly repetitive and costly failure analysis for damage evaluation, resulting in significant cost savings to the industry as a whole.

 

Work Accomplished