Presentation

Electrochemical migration can produce leakage currents and shorts in electronic products. New chemistries used in the electronic assembly process for lead-free materials as well as increased working temperatures brings a protential increase in risk related to electrochemical migration. This presentation will discuss current research related to electrochemical migration associated with lead-free assemblies.

About the Presenter:

Dr. Michael H. Azarian is an assistant research scientist at CALCE. He holds a Ph.D. in Materials Science and Engineering from Carnegie Mellon University, a Masters degree in Metallurgical Engineering and Materials Science from Carnegie Mellon, and a Bachelors degree in Chemical Engineering from Princeton University.

His current research interests include failure mechanisms in electronic components and assemblies and effects of solder joint degradation on reliability of RF electronic products. Dr. Azarian has been leading CALCE's efforts in developing a methodology for reliability capability assessment of electronics manufacturers and suppliers. He has been an invited conference speaker on nano-tribology, and guest instructor and lecturer on reliability and tribology to both industry and academia. His technical publications include papers on electrochemical migration, capacitor reliability, advanced packaging, sensor technology, tribology, and colloid science. He also holds 5 U.S. patents for inventions in data storage and contamination control.