Advanced Physical Inspection Methods for Counterfeit Detection : A Talk by Sina Shahbazmohamadi
Sina Shahbazmohamadi (email@example.com) of CHASE - UConn will present on Advanced Physical Inspection Methods for Counterfeit Detection at the CALCE SMTA conference at College Park, Maryland on June 25th.
There are various physical inspection techniques for electronic parts counterfeit detection ranging from simple optical microscopy to more advanced X-ray imaging. However there is no specific equipment or test technique that can target all counterfeit types and the defects associated with them. This makes counterfeit detection a costly and time-consuming process. In addition, most methods require a subject matter expert (SME) to interpret the test results which in turn leads to additional cost, inefficiency and inconsistency. Another issue associated with this process is the destructive nature of most tests, as having access to the interior features is inevitable. Here we seek to tackle these issues by introducing and optimizing two novel three and four dimensional imaging techniques that can provide us with the necessary information on interior and exterior geometry along with the material composition for tested parts. It will be shown that by applying the proposed modifications, the methods can successfully detect all the defects through a single-imaging session using only two methods thus lowering the cost and time of counterfeit detection. The proposed methods are also totally non-destructive causing no damage to the tested part. Finally, the presence of quantitative results as opposed to qualitative images can potentially eliminate the need of the SME's interpretation and expertise which can further reduce the associated cost and improve the detection consistency.
Dr. Sina Shahbazmohamadi is currently a research fellow at CHASE (Center for Hardware Assurance, Security and Engineering) in University of Connecticut where he studies novel solutions for integrated circuits counterfeit detection and prevention. He is also CHASE's 3D imaging lab manager recently awarded one million dollar for enhancing equipment and counterfeit detection capabilities. He has earned his PhD in mechanical engineering from University of Connecticut in 2013 where he studied the mechanical behavior of thermal barrier coatings (TBCs) used in gas-turbine engines. His efforts in this field led to the invention of a patented technology to predict the life of TBCs non-destructively and have been published in 10 journals and conference proceedings.
CHASE center was established in 2012 to provide the University with a physical and intellectual environment necessary for interdisciplinary hardware-oriented research and applications to meet the challenges of the future in the field of assurance and security. The goal was to create a center of excellence that provides opportunities for interdisciplinary research and educational programs and activities responsive to changing technology and the needs of society.