3rd Annual Symposium on Avoiding, Detecting, and Preventing Counterfeit Electronic Parts

Presented On: December 2-3, 2009
Presented At: Samuel Riggs Alumni Center
University of Maryland, College Park, MD 20742

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Agenda

Session I: Introduction and Scope
Welcome and Introduction Dr. Diganta Das, CALCE, University of Maryland 
The Scope and Magnitude of the Problem Mark Crawford, US Department of Commerce

Counterfeiters Techniques are Constantly Improving to Avoid Detection – Our National Security is Dependent on Us to Keep Up

 Tom Sharpe, SMT Corporation

AS5553 – A New Standard in the Fight Against Counterfeit Parts

 Dan DiMase, Honeywell

International Property Rights Enforcement in the Electronics Industry

 Craig Thurber, U.S. Immigration & Customs Enforcement

Session II: Legal and Law Enforcement Issues
Intellectual Property – The Primary Legal Principle Behind Counterfeit Definitions Prof. Patricia Campbell, University of Maryland

Counterfeit Components and Related Legal Issues

 Laurence E. Pappas, Channel One Group 

Setting up Anti-Counterfeiting Technologies that will Stand Up in Court and are Cost Effective

 David Kalow, Kalow & Springut LLP

Global Perspective on Intellectual Property Issue

 Tim Trainer, Global Intellectual Property Strategy Center, P.C.
Counterfeit Parts Avoidance Training for EEE Parts CALCE Workshop
Anti-Counterfeiting: The Powers That Be – An IP and Legal Perspective CALCE Workshop
Physical, Material, and Electrical Testing Techniques in the Laboratory to Identify and Mitigate EEE Counterfeit Risk CALCE Workshop

December 3, 2009

Session III: Supply Chain Perspective
Counterfeit Electronics – It is Beyond Components Dr. Diganta Das, CALCE / University of Maryland 
Quality & Reliability Issues with Counterfeit ICs Andrew Olney, Analog Devices
Franchised Distribution Role to Mitigate Risk Associated with Counterfeit Parts Bill Palladino, Arrow Electronics
Independent Distributor Perspective: Challenges & Solutions to Mitigate Counterfeit Parts Steve Calabria, Independent Distributors of Electronics Association (IDEA)
Risk Mitigation Tools to Address Today's Complex Global Marketplace Mark Snider, ERAI, Inc.

Session IV: Technical Tools and Methods
Laser Surface Authentication: Natural Randomness as a Fingerprint for Product Authentication Mark McGlade,
Ingenia Technology Limited
Electrical Testing for Counterfeit Detection Mark Marshall,
Integra Technologies
Understanding Industry Perspective in the FAR Council Effort to Create Assurance in the Supply Chain Trey Hodgkins, TechAmerica
First Line of Defense Against Counterfeits Robb Hammond,
American Electronic Resource, Inc.

Supply Chain Panel Discussion

 Moderator: Lisa Gardner, Government Accountability Office
Panelists: Lonnie Hurst, Intel Corporation; Art Mester, Boeing Company; Bill Palladino, Arrow Electronics; Tom Sharpe, SMT Corporation; Mark Snider, ERAI

Session V: Government and Defense Perspective
The Black Swan Effect Jack Stradley, Rochester Electronics
Counterfeit Parts Risk Mitigation Charlie Whitmeyer, Orbital Sciences Corporation
Mitigating Counterfeit Issues through GIDEP Robert Karpen, GIDEP
Microelectronic and Semiconductor Vulnerabilities, a Defense Supply Center Columbus (DSCC) Approach Ernest Reid and Michael Adams,Defense Logistics Agency
Industry Recommendations on Mitigating the Risk Posed by Counterfeit Parts Art Mester, Boeing Company
The Way Forward Brian Hughitt, NASA