The international conference on Sensing, Diagnostics, Prognostics and Control was held in Shanghai,
China, on August 16-18, 2017. The conference was a joint effort by Shanghai Aircraft Customer Service
Corporation, Chongqing Technology and Business University, Carleton University, IEEE Reliability Society,
and the International Society of Measurement, Management and Maintenance. The keynote speakers at
the conference were Prof. Carlos Guedes Soares of Instituto Superior Técnico, Universidade de Lisboa,
Dr. Fu-Kuo Chang, Stanford University and Prof. Michael Pecht of CALCE, University of Maryland.
Prof. Michael Pecht’s keynote was on the topic “Prognostics-Based Qualification for Electronics
Components and Systems”. Prof. Pecht stressed on the point that more and more electronic devices and
products are passing qualification tests, but are failing in the field, resulting in huge losses to their
respective companies. A key problem is the standards and the approaches specified in the standards.
Prof Pecht then discussed an alternative fusion approach that combine physics of failure with
data-analytics using machine learning.