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CALCE Offers Failure Analysis Short Course

Dr. Osterman and attendees of the Failure Analysis of Electronics short course investigate a cross section using CALCE's Scanning Electron Microscopy (SEM) capabilities..

From Nov 14-17, CALCE held its 4-day Failure Analysis short course, which was presented by Dr. Azarian, Dr. Osterman, and Dr. Utter. Companies such as Bosch, Lockheed Martin, and Arris attended the course.

During the course, CALCE offered lectures covering topics from failure mechanisms to tin whiskers to destructive analysis techniques and gave lab demos, including focused ion beams (FID), scanning electron microscopy (SEM) and package thermal analysis.

Guest lecturer Prasad Tota of Mentor Graphics discussed thermal characterization measurements with Mentor's tool T3ster followed by a lab demonstration.


The Center for Advanced Life Cycle Engineering (CALCE), the largest electronic products and systems research center focused on electronics reliability, is dedicated to providing a knowledge and resource base to support the development of competitive electronic components, products, and systems.

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