Tin Whisker
Proceeding of the 6th Interational Sysmposium on Tin Whiskers (2012)
New Article: "Evaluation of Effectiveness of Conformal Coatings as Tin Whisker Mitigation"
Proceedings of the Fifth
International Symposium on Tin Whiskers (2011)
RoHS Recast (June 2011)
Tin Whisker Telecon Presentation (1-11-2012)
New Article on Tin Whiskers Found in a Toyota's Electronic Throttle Controls
Recommended Whisker Measurement Technique
Background
A failure mode is re-emerging that
has been responsible for the loss of billions of dollars worth
of satellites, missiles and other equipment - electrically
conductive 'tin whiskers'. Tin whiskers can develop under
typical operating conditions on any product type that uses
lead-free pure tin coatings. Driven by the accelerating
movement to lead-free products, tin whiskers pose major safety,
reliability and potential liability threats to all makers and
users of high reliability electronics and associated hardware.
Existing approaches are not sufficient to control tin
whiskering in high-reliability systems. The risk is here now,
and unless decisive action is taken soon to fund development
and implementation of a strategic action plan to devise
short-term stopgap procedures and medium-term investigation of
mitigation alternatives, serious consequences are inevitable.
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